触发式测头耦合误差的分离与集成补偿方法研究

Research on separation and integrated compensation methods for coupling errors of Touch-Trigger probes

  • 摘要: 在机测量(on-machine measurement, OMM)系统是实现数控加工闭环质量控制的关键技术,其核心传感器的精度触发式测头因预行程误差严重影响精度,而现有补偿方法因操作复杂且依赖专用设备限制了工程应用。因此,针对触发式测头预行程误差与安装偏心误差相互耦合的难题,提出了一种基于多角度旋转测量的反向分离与集成补偿方法。该方法以标准环规为基准,通过多角度采样与最小二乘法拟合获取环规圆心坐标序列。进而,提出多角度旋转测量与反向分离相结合的策略,解析出耦合在预行程误差中的安装偏心分量,进而建立基于旋转误差与动态半径构建的集成补偿模型。为验证方法有效性,通过主轴多角度旋转触测实验进行对比验证。结果表明,该方法成功分离了安装偏心误差,获得的预行程误差呈现预期规律。通过集成补偿后触发式测头的测量精度由5 μm显著提升至3 μm,为触发式测头在OMM中的误差耦合补偿提供了新思路。

     

    Abstract: On-Machine Measurement (OMM) systems are pivotal technologies for achieving closed-loop quality control in CNC machining. The accuracy of their core sensor, the touch-trigger probe, is significantly compromised by pre-travel error, while existing compensation methods are limited in practical engineering applications due to operational complexity and reliance on specialized equipment. Therefore, to address the challenge of the coupled interaction between the pre-travel error and installation eccentricity error in touch-trigger probes, a method based on multi-angle rotational measurement for reverse separation and integrated compensation is proposed. Using a standard ring gauge as a reference, a sequence of the gauge center coordinates is obtained through multi-angle sampling and least squares fitting. Subsequently, a strategy combining multi-angle rotational measurement with reverse separation is introduced to identify the installation eccentricity component coupled within the pre-travel error. Based on this, an integrated compensation model is established, constructed from rotational error and dynamic probe radius. To validate the effectiveness of the method, comparative verification was conducted through multi-angle spindle rotation touch-trigger experiments. The results demonstrate that the proposed method successfully separates the installation eccentricity error, and the obtained pre-travel error exhibits the expected pattern. Following integrated compensation, the measurement accuracy of the touch-trigger probe is significantly improved from 5 μm to 3 μm. This work provides a novel approach for compensating coupled errors in touch-trigger probes in OMM applications.

     

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