Three-dimensional profile representation technology of diamond cutting edge based on data stitching

The atomic force microscopy(AFM) is an important means to obtain the nano-scale three-dimensional profile of diamond cutting edge. However, its measurement range is small and it is difficult to represent the whole profile of cutting edge involved in cutting process. In this paper, based on the iterative closet point method, the AFM measurement data stitching algorithm is used to obtain the nano-scale three-dimensional profile of cutting edge by stitching sets of data, and the cutting experiment is done for verification. The result shows that the data stitching method used in this paper can be used to represent the three-dimensional profile of tool cutting edge well.